MPI offers a wide range of probe station accessories to support a variety of complete test solutions for the semiconductor industry.
From 50, 150, 200 or 300 mm wafers, ambient coaxial, triaxial, RF and high power Chucks up to an extended range from -60 °C and 300 °C temperature range.
MPI offers carefully selected or optionally custom designed Optics to provide superior imaging for the best possible integration in different applications.
A wide selection of probe station accessories completes the MPI portfolio.
MPI Wafer Chucks für DC, HF und Temperatur-Testanwendungen (-65 °C bis 300 °C)mehr erfahren