FREE WEBINAR Test solutions for Silicon Photonics Device Characterisation

Topic: Test solutions for Silicon Photonics Device Characterisation

Tiny PIC's with Huge Impact: Meeting the Challenges of Photonic Integrated Circuits testing for next-generation networks

Date: June 17, 2020
Time: 11 am EDT | 4 pm GMT



Sebastian Giessmann, Product Marketing Manager @ MPI Corporation
Lawrence Van der Vegt, Subject Matter Expert @ EXFO
Ashkan Seyedi, Senior Research Scientist @ HPE

In this webinar, you will discover how the collaborative EXFO, HPE, and MPI PIC testing solution addresses market challenges, making wafer testing faster, scalable, and more reliable, ultimately improving speed-to-market for component manufacturers. 





Please contact us
Address: Heilbronner Str. 17, 01189 Dresden, Germany
Phone: +49 (0) 351 2138640
Fax: +49 (0) 351 2138650
© 2021 AutomatisierungsTechnik Voigt GmbH
First Contact in Measurement Technology

Our website uses cookies to monitor how the site is used. If you continue to browse we will assume your permission to use cookies.