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MiniTile™ & WedgeTile™ Probe Cards
Each probe is designed for wide temperature ranges and so the probe expansion characteristics are closely matched to the wafer’s expansion characteristics. This allows the user to take a fast measurement while a system is in a settling or thermal stabilization mode and helps compensate for wafer expansion.
- Rigid ceramic and metal chassis
- Integrated cable strain reliefs
- -65°C to 300°C operating temperature ranges
- 1 to 25 pins per site
- Available in regular low leakage (5 femto amps per volt)
- AttoFast™ with guarded tips for 2 femto amp per volt settling time
- High accuracy capacitance measurements
- Low probe to probe capacitance for high accuracy CV measurements and for device characterization and modeling
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