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All in One High Power System
This Measurement Systems provides an all-in-one solution to characterize 2- and 3-pole power devices as field effect (FETs), bipolar junction (BJTs) transistors, diodes, capacitors up to 3 kV an 100 A.
With a single DUT insertion all relevant parameters of off-state and on-state as well as the characteristic capacitances (Ciss, Coss Crss) can be measured. The IV characterization can be done in pulsed, but also in DC mode. This allows a plus in efficiency and prevents any rewiring mistakes.
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