MPI TS2000-SE Automated Wafer Probe System with ShielDEnvironment™

The TS2000-SE from MPI is the first ever 200mm automated engineering probe system on the market integrating innovative features specifically designed to reduce the cost of test. These features are incorporated into the MPI ShielDEnvironment™ for ultra-low noise, very accurate and highly reliable DC/CV, RF and High Power measurements.

 

MPI ShielDEnvironment™ is a high performance local environmental chamber providing excellent EMI- and light-tight shielded test environment for ultra-low noise, low capacitance measurements.

MPI TS2000-SE

A fully configurable part of the MPI ShielDEnvironment™ which allows up to  4-port RF or up to 8-ports DC/Kelvin or a combination of those configurations. Easy to reconfigure with convenient shielding that is MPI ShielDCap™ – a lot of little things which make the difference in simplifying day by day operations. The complete ShielDCap is easily replaceable with the EMI-Shielded version of a probe card holder.

 

Unique STM system prevents opening of any doors during testing – your measurement results are safe. Accidental opening of any system door during a negative chuck temperature is not possible on any event. Furthermore an intelligent dew point control routine avoids acumination during cold testing. The system automatically monitors the flow of CDA or Nitrogen. If the flow is interrupt or insufficient the STM™ turns the chuck automatically into a safe mode – heat the chuck as fast as possible to above dew point. MPI STM™ is the feature that makes measurements with TS2000-SE safer, more reliable and convenient by automatically maintaining a safe test environment.

 

Fact Sheet

 

Data Sheet

MPI TS2000-SEThe TS2000-SE from MPI is the first ever 200 mm automated engineering probe system on the market integrating innovative features specifically designed to reduce the cost of test. These features are incorporated into the MPI ShielDEnvironment™ for ultra-low noise, very accurate and highly reliable DC/CV, RF and High Power measurements.

 

Fact Sheet

 

Data Sheet

 

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