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MPI TS2000-HP High Power Wafer Probe Systems
MPI’s automated TS2000-HP provides reliable on-wafer high power device measurement over wide-temperature range and measurement capability up to 3 kV (triax) / 10 kV (coax) and 600 A (pulsed). Advanced ShielDEnvironment™ offers low-noise and shielded test environment.
Interlocked enabled safety light curtain to protect user from accidental high voltage shock by shutting down the instrument through interlock system.
The system has rear doors, protected by interlock as well in order to provide easy and convenient initial measurement set-up.
MPI ShielDEnvironment™ is a high performance local environmental chamber providing excellent EMI- and light-tight shielded test environment for ultra-low noise, low capacitance measurements.
To prevent arcing between chuck and platen, TS2000-HP platen is specially designed with MPI advanced ArcShield™.
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