T90™

Designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing

90 millimeter ceramic probe card
Optimized for multi-site DC parametric test and multi-site WLR
Compatible with standard 4.5″ rectangular edge card holders
Several Connector options available
Compatible with quick disconnect Celadon triax cable harnesses

Temperature compensated for use from -65°C to 300°C
fA level leakage measurements
Quasi-Kelvin connections available

T90™ with Advanced Cantilever™ technology Series Probe Card The 90 mm tile was designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.